• DocumentCode
    3288506
  • Title

    A functional BIST approach for FIR digital filters

  • Author

    Counil, C. ; Cambon, G.

  • Author_Institution
    Montpellier Univ., France
  • fYear
    1992
  • fDate
    7-9 April 1992
  • Firstpage
    90
  • Lastpage
    95
  • Abstract
    Presents a functional level built-in self-test of digital filters. This BIST technique is based on predetermined patterns which are not dependent on the filter implementation. Many examples show that stuck-at fault coverage is about 98%.<>
  • Keywords
    built-in self test; digital filters; fault location; FIR digital filters; filter implementation; functional BIST approach; functional level; predetermined patterns; stuck-at fault coverage; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Digital filters; Finite impulse response filter; Impulse testing; Registers; Robots; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-7803-0623-6
  • Type

    conf

  • DOI
    10.1109/VTEST.1992.232730
  • Filename
    232730
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3288506