Title :
Fast analysis of the impact of interconnect routing variability on signal degradation
Author :
Ochoa, Juan S. ; Cangellaris, Andreas C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana Champaign, Urbana, IL, USA
Abstract :
A computer model is proposed for the fast predictive analysis of the impact of interconnect routing variability on their broadband signal transmission properties. Through the use of a multi-conductor transmission line model of the interconnect structure and rational function interpolation in the frequency domain, the proposed model propagates routing variability described in terms of a set of properly defined random variables to broadband, stochastic scattering parameters for the transmission channel. In this manner, an efficient Monte Carlo analysis can be performed for the prediction of the statistics of the transient response of the channel due to routing uncertainty.
Keywords :
Monte Carlo methods; electromagnetic wave scattering; interconnections; interpolation; multiconductor transmission lines; network routing; rational functions; signal processing; telecommunication channels; transient response; Monte Carlo analysis; broadband signal transmission properties; channel transient response; computer model; fast predictive analysis; frequency domain; interconnect routing variability impact; interconnect structure; model propagation routing variability; multiconductor transmission line model; random variables; rational function interpolation; routing uncertainty; signal degradation; statistics prediction; stochastic scattering parameters; transmission channel; Computational modeling; Conductors; Random variables; Routing; Scattering; Transmission line matrix methods; Uncertainty;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457905
