Title :
Eye diagram parameter extraction of nano scale VLSI interconnects
Author :
Mehri, Milad ; Sarvari, Reza ; Seydolhosseini, A.
Author_Institution :
Fac. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Abstract :
In this paper, jitter due to both capacitive and inductive coupling is studied. Maximum frequency of driving signal on a wire is limited by its input rise time, fall time, pulse width, and the coupling effect from its neighbors. The analytical expressions to estimate the deterministic jitter time due to these effects are presented. The estimation is based on the fastest and slowest approximation of the signal waveform components. Also, we have extracted the eye opening parameters of the eye diagram. The inductance effects significance is shown on eye opening and jitter time. The 45nm technology is used for estimating the horizontal and vertical eye opening and jitter time. The presented formula is compared with the simulations for some cases and it shows good agreements.
Keywords :
VLSI; approximation theory; integrated circuit interconnections; jitter; nanoelectronics; capacitive coupling; coupling effect; deterministic jitter; driving signal; eye diagram parameter extraction; eye opening parameter extraction; horizontal eye opening estimation; inductance effects; inductive coupling; nanoscale VLSI interconnects; pulse width; signal waveform component approximation; size 45 nm; vertical eye opening estimation; Approximation methods; Couplings; Estimation; Integrated circuit interconnections; Jitter; Simulation; Wires; Eye diagram; Eye opening; Jittre; VLSI Interconnect;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457908
