DocumentCode :
3288638
Title :
BIST linear generator based on complemented outputs
Author :
Voon, L. F C Lew Yan ; Dufaza, C. ; Landrault, C.
Author_Institution :
Montpellier Univ., France
fYear :
1992
fDate :
7-9 April 1992
Firstpage :
137
Lastpage :
142
Abstract :
Autonomous linear finite state machines with both complemented and uncomplemented register outputs (mixed-output ALFSMs) have been investigated for their use as deterministic and pseudo-random test vector generators in a BIST scheme. The authors describe a method for deriving the feedback connections of the mixed-output ALFSM given a deterministic sequence of n n-bit wide test vectors. They also show that the state graph structure is preserved thus enabling the generation of maximum-length sequences if the characteristic polynomial of the connectivity matrix is primitive. An example is given to illustrate the synthesis method of a mixed-output ALFSM based test vector generator. A better solution is obtained compared to conventional uncomplemented output ALFSM.<>
Keywords :
built-in self test; finite state machines; logic testing; BIST scheme; autonomous linear finite state machines; characteristic polynomial; complemented outputs; complemented register outputs; connectivity matrix; deterministic sequence; feedback connections; maximum-length sequences; mixed-output ALFSMs; pseudo-random test vector generator; state graph structure; uncomplemented register outputs; Automata; Automatic testing; Built-in self-test; CMOS technology; Costs; Equations; Hardware; Robots; Silicon; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
Type :
conf
DOI :
10.1109/VTEST.1992.232738
Filename :
232738
Link To Document :
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