• DocumentCode
    3288638
  • Title

    BIST linear generator based on complemented outputs

  • Author

    Voon, L. F C Lew Yan ; Dufaza, C. ; Landrault, C.

  • Author_Institution
    Montpellier Univ., France
  • fYear
    1992
  • fDate
    7-9 April 1992
  • Firstpage
    137
  • Lastpage
    142
  • Abstract
    Autonomous linear finite state machines with both complemented and uncomplemented register outputs (mixed-output ALFSMs) have been investigated for their use as deterministic and pseudo-random test vector generators in a BIST scheme. The authors describe a method for deriving the feedback connections of the mixed-output ALFSM given a deterministic sequence of n n-bit wide test vectors. They also show that the state graph structure is preserved thus enabling the generation of maximum-length sequences if the characteristic polynomial of the connectivity matrix is primitive. An example is given to illustrate the synthesis method of a mixed-output ALFSM based test vector generator. A better solution is obtained compared to conventional uncomplemented output ALFSM.<>
  • Keywords
    built-in self test; finite state machines; logic testing; BIST scheme; autonomous linear finite state machines; characteristic polynomial; complemented outputs; complemented register outputs; connectivity matrix; deterministic sequence; feedback connections; maximum-length sequences; mixed-output ALFSMs; pseudo-random test vector generator; state graph structure; uncomplemented register outputs; Automata; Automatic testing; Built-in self-test; CMOS technology; Costs; Equations; Hardware; Robots; Silicon; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-7803-0623-6
  • Type

    conf

  • DOI
    10.1109/VTEST.1992.232738
  • Filename
    232738