Title :
The SEU in pulse width modulation controllers with soft start and shutdown circuits
Author :
Penzin, S.H. ; Crain, W.R. ; Crawford, K.B. ; Hansel, S.J. ; Koga, R.
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
Abstract :
A study was done of Single Event Upset (SEU) in pulse width modulation (PWM) controllers which feature either soft start or shutdown circuits. Upsets occurring in the soft start circuit of these devices may greatly effect the external circuit depending on the configuration of the PWM
Keywords :
integrated circuit testing; monolithic integrated circuits; power electronics; pulse width modulation; radiation effects; PWM controllers; SEU; pulse width modulation; shutdown circuit; single event upset; soft start circuit; Aerospace control; BiCMOS integrated circuits; Capacitors; Circuit faults; Pulse circuits; Pulse width modulation; Space vector pulse width modulation; Testing; Thyristors; Virtual colonoscopy;
Conference_Titel :
Radiation Effects Data Workshop, 1997 IEEE
Conference_Location :
Snowmass Village, CO
Print_ISBN :
0-7803-4061-2
DOI :
10.1109/REDW.1997.629801
