Title :
Total dose response of Maxim analog multiplexers at two dose rates
Author :
Pease, Ronald ; Kemp, William ; Chave, Joesph ; Islam, Naz ; Shedd, Walter
Author_Institution :
RLP Res., Albuquerque, NM, USA
Abstract :
Samples of MAX338CPE and MAX358CPE 8 channel CMOS analog multiplexers were irradiated at 100 and 0.01 rads/s to a total dose of ~16 krads. Both part types showed a significant increase in leakage current at a total dose as low as 1-2 krads. The only low dose rate sensitivity was for on-resistance in the MAX358, which appears to be a time dependent effect and not a true dose rate effect
Keywords :
CMOS analogue integrated circuits; analogue processing circuits; failure analysis; integrated circuit reliability; leakage currents; multiplexing equipment; radiation effects; 1 to 16 krad; 8 channel multiplexers; CMOS analog multiplexers; MAX338CPE; MAX358CPE; Maxim analog multiplexers; dose rate effect; leakage current; low dose rate sensitivity; on-resistance; time dependent effect; total dose response; Circuit testing; Current supplies; Dosimetry; Leakage current; Monitoring; Multiplexing; Performance evaluation; Power supplies; Switches; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 1997 IEEE
Conference_Location :
Snowmass Village, CO
Print_ISBN :
0-7803-4061-2
DOI :
10.1109/REDW.1997.629803
