• DocumentCode
    3288719
  • Title

    Total dose response of Maxim analog multiplexers at two dose rates

  • Author

    Pease, Ronald ; Kemp, William ; Chave, Joesph ; Islam, Naz ; Shedd, Walter

  • Author_Institution
    RLP Res., Albuquerque, NM, USA
  • fYear
    1997
  • fDate
    35635
  • Firstpage
    84
  • Lastpage
    89
  • Abstract
    Samples of MAX338CPE and MAX358CPE 8 channel CMOS analog multiplexers were irradiated at 100 and 0.01 rads/s to a total dose of ~16 krads. Both part types showed a significant increase in leakage current at a total dose as low as 1-2 krads. The only low dose rate sensitivity was for on-resistance in the MAX358, which appears to be a time dependent effect and not a true dose rate effect
  • Keywords
    CMOS analogue integrated circuits; analogue processing circuits; failure analysis; integrated circuit reliability; leakage currents; multiplexing equipment; radiation effects; 1 to 16 krad; 8 channel multiplexers; CMOS analog multiplexers; MAX338CPE; MAX358CPE; Maxim analog multiplexers; dose rate effect; leakage current; low dose rate sensitivity; on-resistance; time dependent effect; total dose response; Circuit testing; Current supplies; Dosimetry; Leakage current; Monitoring; Multiplexing; Performance evaluation; Power supplies; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1997 IEEE
  • Conference_Location
    Snowmass Village, CO
  • Print_ISBN
    0-7803-4061-2
  • Type

    conf

  • DOI
    10.1109/REDW.1997.629803
  • Filename
    629803
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3288719