Title :
A defect-tolerant design for mask ROMs
Author :
Iwasaki, Kazuhiko ; Fujiwara, Tom ; Kasami, Tadao
Author_Institution :
Fac. of Eng., Chiba Univ., Japan
Abstract :
A new defect-tolerant design technique for mask ROMs is proposed. In the proposed technique a Reed-Solomon code with distance three is utilized. A built-in circuit can repair a defect or defects within a word. The overhead area of the defect-tolerant circuits is estimated to be about 1% for a 4 M-bit mask ROM with eight outputs.<>
Keywords :
VLSI; integrated memory circuits; read-only storage; 4E6 bit; Reed-Solomon code; built-in circuit; defect-tolerant design; mask ROMs; overhead area; Built-in self-test; Circuits; Decoding; Design engineering; Fault tolerance; Fuses; Galois fields; Read only memory; Reed-Solomon codes; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232744
