Title :
BeO Products for Waveguide Systems
Author :
Sibirtsev, S.N. ; Matveichuk, V.F. ; Karikh, N.M.
Keywords :
Dielectric loss measurement; Dielectric losses; Dielectric measurements; Digital-analog conversion; Electromagnetic waveguides; Frequency measurement; Interference; Permittivity measurement; Power generation; UHF measurements;
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
5-7782-0662-3
DOI :
10.1109/APEIE.2006.4292489
