Title :
Partner SRLs for improved shift register diagnostics
Author :
Schafer, James L. ; Policastri, Fred A. ; McNulty, Richard J.
Author_Institution :
IBM, Hopewell Junction, NY, USA
Abstract :
In LSSD devices, one of the biggest problems encountered today is diagnosing a defective shift register (SR) down to a shift register latch (SRL) boundary. This paper describes a SR configuration that will solve this problem with relatively low overhead.<>
Keywords :
logic testing; sequential circuits; shift registers; LSSD devices; SRL boundary; overhead; shift register diagnostics; shift register latch; Clocks; Fault diagnosis; Joining processes; Logic devices; Logic testing; Observability; Shift registers; Strontium; System testing; Throughput;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232749
