Title :
Phase Interactions in the Measurement Assurance of Nanoelectronic Objects
Author :
Zhilin, N.S. ; Maistrenko, Vasilii A. ; Nikonov, A.V. ; Nikonova, Galina V. ; Saifutdinov, C.R.
Keywords :
Connectors; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Permittivity measurement; Phase measurement; Temperature distribution; UHF measurements;
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
5-7782-0662-3
DOI :
10.1109/APEIE.2006.4292493
