Title :
A novel pattern searching method using neural networks and correlation
Author :
Chiu, Chinchuan ; Oki, Tom ; Paolellia, Phil
Author_Institution :
Image Understanding Lab, Sony Corp. of America, Orangeburg, NY, USA
Abstract :
A novel pattern searching method using neural networks and correlation is presented. This method combines the quickness and adaptiveness of neural networks with the accuracy of the mathematical correlation approach. Images are divided into small sub-images which are presented to the trained neural network. Sub-images that may contain the pattern or partial pattern are selected by the neural network. The neural network also provides the approximate location of the pattern, therefore the selected sub-images can be adjusted to contain the complete pattern. Desired patterns can be located by measuring the new sub-images´ correlation values against the reference models in a small area. Experiments show that this superior method is able to find the desired patterns. Moreover, this method is much faster and more adaptable than traditional pattern searching methods.
Keywords :
correlation methods; image recognition; neural nets; adaptiveness; mathematical correlation; neural networks; pattern searching method; sub-images; Brightness; Character recognition; Correlation; Image recognition; Inspection; Manufacturing automation; Neural networks; Pattern recognition; Pixel; Printed circuits;
Conference_Titel :
Neural Networks, 1993. IJCNN '93-Nagoya. Proceedings of 1993 International Joint Conference on
Print_ISBN :
0-7803-1421-2
DOI :
10.1109/IJCNN.1993.716778