DocumentCode :
3288871
Title :
Interface test adapters (ITA) "Design to Build" a primer on rapid availability, reduced cost, and improved maintainability
Author :
Stehle, Cliff ; Douglass, Kirk
Author_Institution :
Anteon Corp., Middletown, RI, USA
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
124
Lastpage :
128
Abstract :
Interface test adapters (ITAs) are truly the place where the "rubber meets the road" in any automated test system (ATS). As the primary electrical interface between the ATS and the unit under test (UUT), the ITA occupies a critical juncture in the overall effectiveness of the ATS concept. For military applications where identical ITA configurations will be produced to support various field or depot installations, ITA reliability, repairability, and cost of production are valid considerations in evaluating design concepts. This paper outlines a "Design to Build" approach that applies to all ITA programs and that is currently being successfully applied to a DoD program that requires interface of a Teradyne Spectrum 9000 Series ATS (using a two-tier mass connection panel) with various units to be tested (line and shop repairable). The design approach described results in an ITA that can be: 1) easily and cost effectively produced (in various quantities to support deployment schedules); 2) electrically configured to replicate legacy system design in a rapid and accurate manner (for non-supportable legacy ATS replacement programs); 3) adapted to various configurations to support a range of UUTs at a field or depot facility; and 4) easily repaired as the removable case design allows full ITA electrical access for troubleshooting and repair. In illustrating the "Design to Build" concept, this paper addresses considerations affecting ITA electrical design, structural integrity, and subassembly concepts.
Keywords :
automatic test equipment; automatic test software; computer interfaces; military computing; Design to Build; ITA electrical design; automated test system; interface test adapters; legacy system; structural integrity; subassembly concepts; troubleshooting; two-tier mass connection panel; unit under test; Assembly; Automatic testing; Costs; Fabrication; Job shop scheduling; Kirk field collapse effect; Production; Programming; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2004. Proceedings
ISSN :
1088-7725
Print_ISBN :
0-7803-8449-0
Type :
conf
DOI :
10.1109/AUTEST.2004.1436788
Filename :
1436788
Link To Document :
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