DocumentCode :
3289013
Title :
Monte Carlo optimization of an industrial tomography system
Author :
Berdondini, Andrea ; Bettuzzi, Matteo ; Bianconi, Davide ; Brancaccio, Rosa ; Casali, Franco ; Cornacchia, Samantha ; Flisch, Alexander ; Lanconelli, Nico ; Morigi, M.P. ; Hofmann, Juergen ; Pasini, Alessandro ; Rossi, Alberto
Author_Institution :
Dept. of Phys., Bari Univ.
Volume :
2
fYear :
2005
fDate :
23-29 Oct. 2005
Firstpage :
856
Lastpage :
859
Abstract :
Computed tomography (CT) is becoming a very useful non-destructive testing technique, in the industrial field, since it permits the detection of small inner defects in a reliable and accurate way. In order to get very good performance, in terms of image contrast and spatial resolution, the configuration of the tomography system has to be optimized carefully. Monte Carlo simulations can be a very helpful method, for choosing different conditions and selecting the best configuration of a CT system. In this paper we present a preliminary optimization of an industrial CT apparatus, obtained by means of Monte Carlo simulations. The system is composed of an X-ray tube, filtering and collimation devices, and a detector made of a scintillator coupled to a CCD camera. We focus our attention on large aluminum objects and investigate the contribution of the scattered radiation. Some options have been simulated, for reducing the scattering photons, thus improving the overall image quality
Keywords :
Monte Carlo methods; X-ray tubes; charge-coupled devices; collimators; computerised tomography; nondestructive testing; scintillation counters; CCD camera; Monte Carlo optimization; X-ray tube; aluminum objects; collimation device; filtering device; image contrast; image quality; industrial computed tomography apparatus; industrial tomography system; nondestructive testing technique; scattered radiation; scattering photons; scintillator detector; spatial resolution; Computed tomography; Computer industry; Electromagnetic scattering; Filtering; Monte Carlo methods; Nondestructive testing; Particle scattering; Spatial resolution; X-ray imaging; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
ISSN :
1095-7863
Print_ISBN :
0-7803-9221-3
Type :
conf
DOI :
10.1109/NSSMIC.2005.1596390
Filename :
1596390
Link To Document :
بازگشت