DocumentCode :
3289035
Title :
Checksum-based concurrent error detection in linear analog systems with second and higher order stages
Author :
Chatterjee, Abhijit
Author_Institution :
General Electric Res. & Dev. Center, Schenectady, NY, USA
fYear :
1992
fDate :
7-9 April 1992
Firstpage :
286
Lastpage :
291
Abstract :
The problem of concurrent error detection in a class of linear analog systems containing second and higher order stages is discussed in this paper. Individual stages of such systems have transfer functions whose denominators contain the terms s/sup 2/,s/sup 3/,. . ., where s is the complex frequency of the transfer function H/sub i/(s) of the i´th stage. Such systems are widely used to realize a variety of analog and switched-capacitor filters and control systems. The author assumes that a fault can cause the value of a passive circuit component to deviate from its normal value, result in a short or an open line or change the operating characteristics of the operational amplifiers. A small amount of additional hardware is used to perform error detection, its size being virtually independent of the size of the circuit on which error detection is to be performed. Further, the sensitivity of the error detection scheme to changes in the component values can be easily adjusted.<>
Keywords :
active filters; analogue circuits; error detection; graph theory; linear network analysis; matrix algebra; switched capacitor filters; SC filters; checksum-based detection; concurrent error detection; higher order stages; linear analog systems; operational amplifiers; second order stages; stage graphs; switched-capacitor filters; transfer functions; Active filters; Circuits; Control systems; Differential equations; Encoding; Fast Fourier transforms; Fault tolerance; Hardware; Operational amplifiers; Transfer functions;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
Type :
conf
DOI :
10.1109/VTEST.1992.232767
Filename :
232767
Link To Document :
بازگشت