Title :
Self-testing and self-checking combinational circuits with weakly independent outputs
Author :
Sogomonjan, E.S. ; Goessel, M.
Author_Institution :
Inst. of Control Sci., Acad. of Sci., Moscow, Russia
Abstract :
The authors propose a structure dependent method for the systematic design of self-checking error detection circuits which is well adapted to the technical fault model considered. For online detection, the hardware is in normal operation mode, and for testing in test mode. In the test mode, these error detection circuits guarantee a 100% fault coverage for single stuck-at-0/1 faults and a high fault coverage for arbitrary faults.<>
Keywords :
automatic testing; combinatorial circuits; error detection; fault location; logic design; logic testing; combinational circuits; error detection circuits; fault model; high fault coverage; online detection; self-checking; structure dependent method; systematic design; weakly independent outputs; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Fault tolerant systems; Hardware; Monitoring;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232769
