DocumentCode :
3289238
Title :
Support Vector Regression and Immune Clone Selection Algorithm for Intelligent Electronic Circuit Fault Diagnosis
Author :
Tian, WenJie ; Liu, JiCheng ; Geng, Yu ; Ai, Lan
Author_Institution :
Autom. Inst., Beijing Union Univ., Beijing, China
fYear :
2009
fDate :
16-17 May 2009
Firstpage :
297
Lastpage :
300
Abstract :
In the analysis of electronic circuit fault diagnosis based on support vector regression (SVR), irrelevant or correlated features in the samples could spoil the performance of the SVR classifier, leading to decrease of prediction accuracy. In order to solve the problems mentioned above, this paper used rough sets as a preprocessor of SVR to select a subset of input variables and employed the immune clone selection algorithm (ICSA) to optimize the parameters of SVR. Additionally, the proposed ICSA-SVR model that can automatically determine the optimal parameters was tested on the prediction of electronic circuit fault. Then, we compared the proposed ICSA-SVR model with other artificial intelligence models of (BPN and fix-SVR). The experiment indicates that the proposed method is quite effective and ubiquitous.
Keywords :
artificial intelligence; circuit CAD; fault diagnosis; regression analysis; rough set theory; support vector machines; ICSA-SVR model; SVR classifier; artificial intelligence models; immune clone selection algorithm; intelligent electronic circuit fault diagnosis; rough sets; support vector regression; Accuracy; Circuit analysis; Circuit testing; Cloning; Data preprocessing; Electronic circuits; Fault diagnosis; Input variables; Performance analysis; Rough sets; electronic circuit; fault diagnosis; immune clone selection algorithm; rough set; support vector regression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits, Communications and Systems, 2009. PACCS '09. Pacific-Asia Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-0-7695-3614-9
Type :
conf
DOI :
10.1109/PACCS.2009.116
Filename :
5232345
Link To Document :
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