• DocumentCode
    328925
  • Title

    A new approach to via minimization problem in VLSI chip design

  • Author

    Yong, Seong ; Kim, Won Gyoum ; Han, Mun-sung ; Lee, Won Don

  • Author_Institution
    Dept. of Comput. Sci., Chung Nam Nat. Univ., Taejon, South Korea
  • Volume
    2
  • fYear
    1993
  • fDate
    25-29 Oct. 1993
  • Firstpage
    1495
  • Abstract
    Hopfield neural networks (HNN) and simulated annealing (SA) are two recent approaches to solving many combinatorial optimization problems. But, the disadvantages of HNN are that it can often converge at local minimum and the quality of solutions depends on the initial state because of sensitivity of parameterization. On the other hand, SA is designed to cope with the problem of convergence to a local minimum. SA, however, requires unacceptably large computing time. So, a new algorithm called mean field annealing (MFA) which can be interpreted as a generalization of HNN, is applied to optimization problems efficiently. In this paper, we propose a new approach based on MFA to solving of the minimization problem. Also we show that our approach can be applied to multi-layer as well as two-layer routing, and optimal solutions can be obtained by properly adjusting the parameter in the given energy function.
  • Keywords
    Hopfield neural nets; VLSI; circuit CAD; convergence of numerical methods; integrated circuit design; minimisation; network routing; simulated annealing; Hopfield neural networks; VLSI chip design; combinatorial optimization; convergence; energy function; mean field annealing; minimization; multi-layer routing; simulated annealing; two-layer routing; Chip scale packaging; Educational institutions; Hopfield neural networks; Integrated circuit interconnections; Intelligent networks; Minimization; Systems engineering and theory; Topology; Very large scale integration; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1993. IJCNN '93-Nagoya. Proceedings of 1993 International Joint Conference on
  • Print_ISBN
    0-7803-1421-2
  • Type

    conf

  • DOI
    10.1109/IJCNN.1993.716828
  • Filename
    716828