Title :
Image charge method for electrostatic calculations in field emission diodes
Author :
Sáenz, J.J. ; Mesa, G.
Author_Institution :
Dept. de Fisica de la Mater. Condensada, Univ. Autonoma de Madrid, Spain
Abstract :
We present a method to calculate the interaction energies of a charge placed between a metallic tip of arbitrary shape and a sample surface. The basic idea is to replace the electrodes by a set of image charges. These charges are adjusted in order to fit the boundary conditions on the surfaces. As an application of the method, we describe the field characteristics of a field-emission diode as a function of the gap between the electrodes for different tip shapes. The three-dimensional potential barrier (including image corrections) for electron field emission is also calculated
Keywords :
diodes; electron field emission; electrostatics; vacuum microelectronics; electron field emission; electrostatic field; field emission diode; image charge method; interaction energy; metallic tip electrode; surface boundary condition; three-dimensional potential barrier; Boundary conditions; Diodes; Electrodes; Electron emission; Electrostatics; Geometry; Iron; Potential energy; Shape; Surface fitting;
Conference_Titel :
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location :
St. Petersburg
Print_ISBN :
0-7803-3594-5
DOI :
10.1109/IVMC.1996.601785