DocumentCode :
3289275
Title :
The emergence of high volume copper ball bonding
Author :
Deley, Michael ; Levine, Lee, Sr.
Author_Institution :
Ball Bonder Marketing, Kulicke & Soffa Industries Inc., Willow Grove, PA, USA
fYear :
2004
fDate :
July 14-16, 2004
Firstpage :
186
Lastpage :
190
Abstract :
Copper ball bonding has emerged as a high-volume semiconductor assembly process. It already is well established in the high-power, low-pin count market segment. In addition to having better properties than gold, copper provides higher electrical and thermal conductivity, higher strength and stiffness, and better intermetallic reliability than comparable gold ball bonds. As these benefits are demonstrated, it migrates into higher I/O, more demanding, fine pitch product lines. Cost savings achievable with copper ball bonding are substantial and represent a major cost improvement for our highly competitive industry.
Keywords :
copper; electrical conductivity; integrated circuit bonding; integrated circuit economics; integrated circuit packaging; thermal conductivity; Cu; electrical conductivity; fine pitch product; gold ball bonds; high volume copper ball bonding; high-volume semiconductor assembly process; intermetallic reliability; low-pin count market; stiffness properties; strength properties; thermal conductivity; Bonding; Copper; Costs; Electronics packaging; Gold; Metals industry; Semiconductor device manufacture; Strontium; Thermal conductivity; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 2004. IEEE/CPMT/SEMI 29th International
ISSN :
1089-8190
Print_ISBN :
0-7803-8582-9
Type :
conf
DOI :
10.1109/IEMT.2004.1321658
Filename :
1321658
Link To Document :
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