DocumentCode :
32893
Title :
DArT: A Component-Based DRAM Area, Power, and Timing Modeling Tool
Author :
Hsiu-Chuan Shih ; Pei-Wen Luo ; Jen-Chieh Yeh ; Shu-Yen Lin ; Ding-Ming Kwai ; Shih-Lien Lu ; Schaefer, Anna ; Cheng-Wen Wu
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
33
Issue :
9
fYear :
2014
fDate :
Sept. 2014
Firstpage :
1356
Lastpage :
1369
Abstract :
DRAM renovation calls for a holistic architecture exploration to cope with bandwidth growth and latency reduction need. In this paper, we present DRAM area power timing (DArT), a DRAM area, power, and timing modeling tool, for array assembly and interface customization. Through proper design abstraction, our component-based modeling approach provides increased flexibility and higher accuracy, making DArT suitable for DRAM architecture exploration and performance estimation. We validate the accuracy of DArT with respect to the physical layout and circuit simulation of an industrial 68 nm commodity DRAM device as a reference. The experiment results show that the maximum deviations from the reference design, in terms of area, timing, and power, are 3.2%, 4.92%, and 1.73%, respectively. For an architectural projection by porting it to a 45 nm process, the maximum deviations are 3.4%, 3.42%, and 8.57%, respectively. The combination of modeling performance, flexibility, and accuracy of DArT allows us to easily explore new DRAM architectures in the future, including 3-D stacked DRAM.
Keywords :
DRAM chips; flexible electronics; integrated circuit modelling; timing circuits; 3D stacked DRAM; DRAM architecture exploration; DRAM area power timing; array assembly; component-based modeling approach; interface customization; performance estimation; timing modeling tool; Arrays; Delays; Integrated circuit modeling; Random access memory; Wires; 3-D DRAM; DRAM; architecture exploration; modeling and simulation; performance estimation;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2014.2323203
Filename :
6879579
Link To Document :
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