DocumentCode
3289313
Title
A novel preliminary study on microwave characterization of Siamese Mangoes ripeness at K-Band
Author
Abdul Khalid, M.F. ; Ramli, A.S. ; Baba, N.H. ; Saad, H.
Author_Institution
Fac. of Electr. Eng., Univ. Teknol. MARA (UiTM)
fYear
2008
fDate
2-4 Dec. 2008
Firstpage
143
Lastpage
147
Abstract
This project presents a microwave non-destructive testing (MNDT) method to determine the ripeness of Siamese mangoes at a frequency range of 18 to 26.5 GHz (K-Band) using free space microwave measurement (FSMM) system. The basic components of the FSMM system are spot focusing horn lens antennas, a vector network analyzer (VNA) and a computer. In this method, the free space reflection, S11 and transmission, S21 coefficients are measured for the samples sandwiched between two Teflon plates that are quarter wavelengths at mid-band. The thru, reflect and line (TRL) calibration technique is used to eliminate the effect of undesirable multiple reflections. The extracted S11 and S21 are keyed in a developed algorithm to calculate the complex permittivity of moisture contents within the samples. Results have shown that the dielectric constants for ripe and unripe mangoes are between 26.3 to 29.5 and 26.1 to 29.2 respectively. Other parameters including loss factor and loss tangent are also discussed.
Keywords
agricultural products; calibration; horn antennas; lens antennas; microwave measurement; K-band; Siamese mangoes ripeness; Teflon plates; computer; free space microwave measurement system; free space reflection; frequency 18 GHz to 26.5 GHz; line calibration; microwave nondestructive testing method; moisture content permittivity; reflect calibration; spot focusing horn lens antennas; thru calibration; vector network analyzer; Antenna measurements; Extraterrestrial measurements; Frequency measurement; K-band; Lenses; Microwave measurements; Microwave theory and techniques; Nondestructive testing; Reflection; System testing; Complex Permittivity; FSMM; K-Band; MNDT; Siamese Mangoes;
fLanguage
English
Publisher
ieee
Conference_Titel
RF and Microwave Conference, 2008. RFM 2008. IEEE International
Conference_Location
Kuala Lumpur
Print_ISBN
978-1-4244-2866-3
Electronic_ISBN
978-1-4244-2867-0
Type
conf
DOI
10.1109/RFM.2008.4897370
Filename
4897370
Link To Document