• DocumentCode
    3289376
  • Title

    Analytical modeling of thermal effects on prolate ellipsoid field emission microemitter

  • Author

    Zhao, Hongwei ; Wang, Baoping ; Wang, Chen ; Sin, Johnny K O ; Poon, Vincent M C

  • Author_Institution
    Dept. of Electron. Eng., Southeast Univ., Nanjing, China
  • fYear
    1996
  • fDate
    7-12 Jul 1996
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    Thermal distribution and thermal effects are very important to the stability and reliability of field emission devices. In order to study the thermal effects on the performance of field emission devices, an analytical model far a prolate ellipsoid field emitter is presented in this paper. Temperature distribution for this model is derived by accurately solving the thermal condition equations, which is appropriate for all kinds of emitters. Thermal effects on the field emission are also investigated. Results show that the temperature increase in the bulk of the field emitter in normal working conditions does not result in failure of the field emitter. The simulation results agree well with experimental results
  • Keywords
    electron field emission; temperature distribution; vacuum microelectronics; analytical model; field emission device; prolate ellipsoid microemitter; reliability; simulation; stability; temperature distribution; thermal effects; Analytical models; Ellipsoids; Equations; Microelectronics; Reliability engineering; Temperature distribution; Thermal conductivity; Thermal engineering; Thermal factors; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    0-7803-3594-5
  • Type

    conf

  • DOI
    10.1109/IVMC.1996.601786
  • Filename
    601786