DocumentCode :
3289573
Title :
Integrating interchangeable virtual instruments (IVI) resources with ATEasy
Author :
Yazma, Ron
Author_Institution :
Geotest Marvin Test Syst. Inc., Irvine, CA, USA
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
185
Lastpage :
189
Abstract :
New software technology, such as interchangeable virtual instruments (IVI), benefits customers of automatic test equipment by reducing cost of ownership. The costs of re-hosting test program software due to obsolescence issues can be reduced by using application development environments such as ATEasy and IVI. ATEasy provides the means of changing instruments and test system resources similar to IVI via its interchangeable instrument technology (I2T). IVI further allows the customer end-user to make the change without compiling the application, as ATEasy would require. By combining the power of both technologies, both the customer and the integrator benefit from maximum flexibility and options for instrumentation obsolescence. This paper discusses the issues and concerns in applying this strategy to a deliverable test system. It discusses some of the obstacles and "speed-bumps" that were overcome during development. Although IVI has been around for over 5 years, it\´s still a new technology and early adopters have the work around issues such as driver availability, varying levels of support by equipment vendors, and the lack of experience in the industry applying IVI. The ATEasy environment can leverage the current, state-of-the art technology while positioning the user and integrator for the future.
Keywords :
automatic test equipment; automatic test software; distributed object management; software architecture; virtual instrumentation; automatic test equipment; automatic test software; deliverable test system; distributed object management; interchangeable virtual instruments; software architecture; Code standards; Costs; Hardware; Instruments; Signal generators; Software quality; Software standards; Software testing; Standards development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2004. Proceedings
ISSN :
1088-7725
Print_ISBN :
0-7803-8449-0
Type :
conf
DOI :
10.1109/AUTEST.2004.1436825
Filename :
1436825
Link To Document :
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