Title :
On Testing Delay Faults In Macro-based Combinational Circuits
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Keywords :
Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Delay effects; Hardware; Integrated circuit interconnections; Logic circuits; Propagation delay; Semiconductor device testing;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629813
