Title :
Tests of Hypothesis About Homogeneity of Means
Author :
Lemeshko, B.Y. ; Mirkin, E.P. ; Gerasimov, M.A.
Keywords :
Buildings; Computer aided software engineering; Convergence; Integrated circuit modeling; Integrated circuit packaging; Parametric statistics; Robustness; Statistical analysis; Statistical distributions; Testing;
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
5-7782-0662-3
DOI :
10.1109/APEIE.2006.4292560
