DocumentCode :
3289826
Title :
Investigation of Sheffe Criteria Statistic Distributions in Case of Normality Assumption Failure
Author :
Lemeshko, B.Y. ; Ponomarenko, V.M.
fYear :
2006
fDate :
26-28 Sept. 2006
Firstpage :
288
Lastpage :
288
Keywords :
Buildings; Computer aided software engineering; Convergence; Integrated circuit modeling; Integrated circuit packaging; Parametric statistics; Robustness; Statistical analysis; Statistical distributions; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
5-7782-0662-3
Type :
conf
DOI :
10.1109/APEIE.2006.4292561
Filename :
4292561
Link To Document :
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