A rigorously defined method for maximized, automated, turnkey, TPS migration

As a result of recent R&D work on instrument independent test programs and instrument independent interfaces, the authors developed a rigorously defined method for automating the migration of legacy test programs to new test platforms. Based on the theory of real systems, the method extracts instrument independent requirements from legacy test programs/platforms and inputs the requirements into instrument independent interfaces on new test platforms. The method reduces and even eliminates integration time on the new test platform. Generically the method is implemented with 1) well-defined data structures that prescribe test-program requirements, individual test requirements, test conditions, and capability/signal types; 2) well-defined data structures that prescribes the relationship between test-program requirements, test requirements, test conditions, & capability/signal types; 3) a realistic software model of legacy test platforms with which legacy test programs are integrated; and 4) an instrument independent (i.e., signal based) interface on the new physical test platform. Since XML is a well-accepted data-definition language and the migration method both drives and is driven by data structures, the authors´ specific incarnation of the method is based on XML/ATML schemas. Legacy test programs are run against software models of legacy test platforms to generate requirements (defined in XML/ATML) for the legacy test-programs. The requirements can then be input to instrument independent interfaces on new physical test platforms. The interface then sets up the physical hardware accordingly and executes the tests. Both the legacy test-platform model and the new test-platform interfaces are generated from XML definitions of the test platforms. The legacy migration method is logically simple, innovative, and robust.