Title :
A Comprehensive Fault Macromodel For Opamps
Author :
Pan, Chen-Yang ; Cheng, Kwang-Ting ; Gupta, Sandeep
Keywords :
Active filters; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Computer errors; Computer interfaces; Degradation; Electrical fault detection; Fault detection;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629815