Title :
Electrical Characterization of a Mapham Inverter Using Pulse Testing Techniques
Author :
Baumann, E.D. ; Myers, I.T. ; Hammoud, A.N.
Author_Institution :
Sverdrup Technology, Inc., NASA Lewis Research Center, Cleveland, Ohio
Keywords :
Aerospace testing; Costs; NASA; Power electronics; Power system reliability; Power system simulation; Power systems; Pulse inverters; Pulse power systems; System testing;
Conference_Titel :
Energy Conversion Engineering Conference, 1990. IECEC-90. Proceedings of the 25th Intersociety
Print_ISBN :
0-8169-0490-1
DOI :
10.1109/IECEC.1990.716931
