• DocumentCode
    3290179
  • Title

    Singular value decomposition for texture defect detection in visual inspection systems

  • Author

    Tomczak, L. ; Mosorov, V.

  • Author_Institution
    Dept. of Comput. Eng., Lodz Tech. Univ., Stefanowskiego
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    131
  • Lastpage
    133
  • Abstract
    In this paper the authors propose an algorithm for texture defects detection, which doesn´t use supervised classification. The algorithm can be simply applied in an automatic visual inspection system. For localization of texture defects features calculation of each non-overlapping region of an image via the singular value decomposition (SVD) and image processing techniques. In next step the algorithm uses the fuzzy c-means clustering (FCM) to classify each region into two clusters. Finally the authors define a distance between centres of defective and non-defective clusters using some threshold value chosen empirically
  • Keywords
    automatic optical inspection; fuzzy systems; image processing; image texture; singular value decomposition; automatic visual inspection system; defective clusters; fuzzy c-means clustering; image processing techniques; nondefective clusters; nonoverlapping region; singular value decomposition; texture defect detection; Classification algorithms; Clustering algorithms; Digital images; Fabrics; Image processing; Inspection; Matrix decomposition; Singular value decomposition; Surface texture; Surface waves; automatic visual inspection system; singular value decomposition; texture defects detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Perspective Technologies and Methods in MEMS Design, 2006. MEMSTECH 2006. Proceedings of the 2nd International Conference on
  • Conference_Location
    Lviv
  • Print_ISBN
    966-553-517-X
  • Type

    conf

  • DOI
    10.1109/MEMSTECH.2006.288681
  • Filename
    4068445