Title :
Physicochemical, electrical and stability properties of carbon black/polyesterimide thick-film resistors
Author :
Dziedzic, Andrzej
Author_Institution :
Faculty of Microsystem Electronics and Photonics, Wroclaw University of Technology, Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland, Phone/Fax: +48 - 71 - 355 48 22, andrzej.dziedzic@pwr.wroc.pl
Abstract :
This paper describes carbon/polyesterimide thick-film resistive composites. Polyesterimide (PEI) resin with high thermal durability served as an insulative matrix whereas medium structure carbon black (MSCB), blend of MSCB and graphite (G), and high structure carbon black (HSCB) have been used as an active phase. Chosen physicochemical investigations, standard electrical measurements (dependence of basic electrical properties on kind and content of conductive filler, curing method and curing temperature) as well as nonstandard electrical methods (1/f noise and voltage nonlinearity properties) and various stability tests have been used for complete description of MSCB/PEI, (MSCB+G)/PEI and HSCB/PEI thick-film resistor series.
Keywords :
1/f noise; Polymer thick film; fabrication; long-term stability; percolation; pulse durability; resistor; sheet resistance; third harmonic; Conductivity measurement; Curing; Electric variables measurement; Insulation; Measurement standards; Noise measurement; Resins; Resistors; Stability; Thickness measurement; 1/f noise; Polymer thick film; fabrication; long-term stability; percolation; pulse durability; resistor; sheet resistance; third harmonic;
Conference_Titel :
Polymers and Adhesives in Microelectronics and Photonics, Polytronic, 2005. Polytronic 2005. 5th International Conference on
Print_ISBN :
0-7803-9553-0
DOI :
10.1109/POLYTR.2005.1596480
