DocumentCode
3290608
Title
New optical switches enable automated testing with true flexibility
Author
Bitting, Michael
Author_Institution
Polatis Ltd., McKinney, TX, USA
fYear
2004
fDate
20-23 Sept. 2004
Firstpage
361
Lastpage
366
Abstract
The proliferation of fiber optic systems in military and avionics platforms is driven by the ever increasing need for higher data rates to support multi-sensor data fusion. Traditionally, the test systems to support these optical deployments are manual and inefficient. Increasingly fast optical components require optical test equipment that is very expensive. To make cost effective test suites, it is essential that these high value resources be used efficiently. This is most effectively accomplished through test architectures that are remotely controlled and automatically scheduled. These test architectures also enable a diverse set of testing applications to be simultaneously executed within an optical test lab or manufacturing environment. The advent of optical matrix switching technology with sub 1dB insertion loss performance and repeatability measured in milli dB´s opens up new doors for highly efficient, remotely controlled, automated test systems. The ultra low loss aspects of these switches enable distributed test architectures that were previously unrealizable. Distributed test architectures create a test environment where expensive test equipment can be leveraged over a greater number of test samples in a more timely and automated fashion. This allows the lab manager to prioritize and schedule tests across many users, DUTs, and test equipment bays in an operation that can run 24/7. This paper explores the enabling photonic switch technology and a couple generic test architectures that can be applied in a variety of automated applications to increase test equipment usage and efficiency, thus lowering end costs for deployable fiber optic components and systems.
Keywords
automatic test equipment; automatic test software; optical engineering computing; optical fibre testing; photonic switching systems; automated testing; distributed test architecture; optical matrix switching technology; optical switch; optical test equipment; photonic switch technology; Automatic control; Automatic testing; Costs; Job shop scheduling; Optical devices; Optical fibers; Optical losses; Optical switches; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON 2004. Proceedings
ISSN
1088-7725
Print_ISBN
0-7803-8449-0
Type
conf
DOI
10.1109/AUTEST.2004.1436883
Filename
1436883
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