• DocumentCode
    3290999
  • Title

    Using MODIS land products to estimate regional evapotranspiration

  • Author

    Xiong, Yujiu ; Qiu, GuoYu

  • Author_Institution
    Dept. of Water Resources & Environ., Sun Yat-Sen Univ., Guangzhou, China
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    3882
  • Lastpage
    3885
  • Abstract
    Evapotranspiration (ET) is one of the most important land surface processes for terrestrial ecosystems because it strongly relates to both the energy balance and the mass balance of these ecosystems. Though there are many ground based approaches to estimate ET, it is still a challenge to estimate ET by remote sensing for most applications. A methodology was proposed to calculate regional actual ET by using the energy balance equation and MODIS products, i.e., MOD11A2, MOD13A2 and MCD43B3. The key point in the proposed method is that a cloud coefficient was introduced to adjust the clear days in a given period, because the MODIS products represent a mean and most cloudless condition in that time interval. A case study was carried out in Jinghe River Basin, located in the southern part of the Loess Plateau, China. The results showed that the proposed method had reasonable accuracy, with an absolute error of 47 mm/a when compared with the ET calculated by using water balance equation. This accuracy is acceptable for most application purposes.
  • Keywords
    evaporation; hydrological techniques; radiometry; remote sensing; rivers; transpiration; China; Jinghe River Basin; Loess Plateau; MCD43B3; MOD11A2; MOD13A2; MODIS land products; cloud coefficient; energy balance; land surface processes; mass balance; meteorological data; regional evapotranspiration; remote sensing; terrestrial ecosystems; Clouds; Equations; Heating; Land surface; MODIS; Mathematical model; Remote sensing; Remote sensing; evaporation; meteorological data; transpiration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5649050
  • Filename
    5649050