A hemispherical test fixture for measuring the wavefields generated in an anisotropic solid

The design and fabrication of an experimental system for measurement of wavefields in anisotropic materials are described. In the test fixture, a source transducer is affixed to the flat portion of a hemisphere of the anisotropic solid. A receiving transducer having a large field of view (FOV) is scanned over the surface of the hemisphere by a motorized C-arm, mapping out the wavefield generated in the specimen. The hemispherical shape of the test specimen permits scanning the wavefield over nearly a full 2π solid angle, an improvement over the limited angular range afforded by a flat panel of the anisotropic solid. The authors report the results of preliminary experiments designed to evaluate the fixture