• DocumentCode
    3291401
  • Title

    Apply tapping mode Atomic Force Microscope with CD/DVD pickup head in fluid

  • Author

    Shih-Hsun Yen ; Jim-Wei Wu ; Li-Chen Fu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    June 30 2010-July 2 2010
  • Firstpage
    6549
  • Lastpage
    6554
  • Abstract
    This paper proposes a tapping mode scanning sample type Atomic Force Microscope (AFM) equipped with a CD/DVD pick-up-head (PUH) used to measure the deflection of the cantilever beam of the probe in the liquid. To start with, we build an adaptive Quality-Factor-controller (Q-controller) to modulate the interaction force between the tip and the sample. To implement the above systems, we have designed a novel AFM mechanism and proposed an adaptive sliding-mode controller for it. For testing the system capability and analyzing the biomorphic change of the sample in liquid, we have conducted a series of experiments, and the results can help us to understand more about the mechanism of the sample in liquid.
  • Keywords
    Q-factor; adaptive control; atomic force microscopy; cantilevers; digital versatile discs; CD/DVD pickup head; Q-controller; adaptive quality-factor-controller; biomorphic change; cantilever beam; tapping mode atomic force microscope; Adaptive control; Atomic beams; Atomic force microscopy; Atomic measurements; DVD; Force measurement; Probes; Programmable control; Sliding mode control; Structural beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2010
  • Conference_Location
    Baltimore, MD
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-7426-4
  • Type

    conf

  • DOI
    10.1109/ACC.2010.5531415
  • Filename
    5531415