DocumentCode
3291401
Title
Apply tapping mode Atomic Force Microscope with CD/DVD pickup head in fluid
Author
Shih-Hsun Yen ; Jim-Wei Wu ; Li-Chen Fu
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2010
fDate
June 30 2010-July 2 2010
Firstpage
6549
Lastpage
6554
Abstract
This paper proposes a tapping mode scanning sample type Atomic Force Microscope (AFM) equipped with a CD/DVD pick-up-head (PUH) used to measure the deflection of the cantilever beam of the probe in the liquid. To start with, we build an adaptive Quality-Factor-controller (Q-controller) to modulate the interaction force between the tip and the sample. To implement the above systems, we have designed a novel AFM mechanism and proposed an adaptive sliding-mode controller for it. For testing the system capability and analyzing the biomorphic change of the sample in liquid, we have conducted a series of experiments, and the results can help us to understand more about the mechanism of the sample in liquid.
Keywords
Q-factor; adaptive control; atomic force microscopy; cantilevers; digital versatile discs; CD/DVD pickup head; Q-controller; adaptive quality-factor-controller; biomorphic change; cantilever beam; tapping mode atomic force microscope; Adaptive control; Atomic beams; Atomic force microscopy; Atomic measurements; DVD; Force measurement; Probes; Programmable control; Sliding mode control; Structural beams;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference (ACC), 2010
Conference_Location
Baltimore, MD
ISSN
0743-1619
Print_ISBN
978-1-4244-7426-4
Type
conf
DOI
10.1109/ACC.2010.5531415
Filename
5531415
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