DocumentCode :
329168
Title :
Thick Polycristalline Silicon For Surface Micromechanical Applications: Deposition, Structuring And Mechanical Characterization
Author :
Lange, P. ; Kirsten, M. ; Riethmüller, W. ; Wenk, B. ; Zwicker, G. ; Morante, J.R. ; Ericson, F. ; Schweitz, J.A.
Author_Institution :
Fraunhofer-Institut fur Siliziumtechnologie
Volume :
1
fYear :
1995
fDate :
25-29 Jun 1995
Firstpage :
202
Lastpage :
203
Keywords :
Chemical vapor deposition; Dry etching; Inductors; Lithography; Mechanical factors; Micromechanical devices; Residual stresses; Silicon; Surface cracks; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors and Actuators, 1995 and Eurosensors IX.. Transducers '95. The 8th International Conference on
Print_ISBN :
91-630-3473-5
Type :
conf
DOI :
10.1109/SENSOR.1995.717139
Filename :
717139
Link To Document :
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