• DocumentCode
    3292128
  • Title

    Robust test design for reliability estimation with modeling error when combining full system and subsystem tests

  • Author

    Maranzano, C.J. ; Spall, J.C.

  • Author_Institution
    Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
  • fYear
    2010
  • fDate
    June 30 2010-July 2 2010
  • Firstpage
    3741
  • Lastpage
    3746
  • Abstract
    This paper develops a method for finding a robust test plan, which consists of a mixture of full system and subsystem tests, to estimate the reliability of a system given that the model for the system reliability is flawed. A robust test plan is developed by trading off the number of full system and subsystem tests to minimize the mean-squared error (MSE) of the maximum likelihood estimate (MLE) of system reliability. The MSE is decomposed into the variance of the MLE and a bias from incorrectly specifying the model that relates the subsystem reliabilities to the full system reliability (series, parallel, other). The variance of the MLE is based on the inverse Fisher Information. The bias is due to the modeling error. A demonstration of the test plan determination is given for a hypothetical system by trading off between the MSE (estimation accuracy), the degree of modeling error, and the cost of doing system and subsystem tests. A Pareto frontier can be identified, as illustrated in the paper.
  • Keywords
    maximum likelihood estimation; mean square error methods; reliability theory; Pareto frontier; full system test; inverse Fisher Information; maximum likelihood estimate; mean-squared error; robust test design; subsystem tests; system reliability estimation; Costs; Error correction; Estimation error; Maximum likelihood estimation; Parameter estimation; Reliability; Robust control; Robustness; System testing; Uncertainty; Maximum Likelihood Estimation; Mean-Squared Error; Model Bias; Reliability; Test Sizing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2010
  • Conference_Location
    Baltimore, MD
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-7426-4
  • Type

    conf

  • DOI
    10.1109/ACC.2010.5531454
  • Filename
    5531454