Title :
A histogram based AM-BIST algorithm for ADC characterization using imprecise stimulus
Author :
Parthasarathy, Kumar L. ; Jin, Le ; Kuye, Turker ; Chen, Degang ; Geiger, Randall
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Abstract :
A new method enabling the use of stationary non-linear signals has been proposed for testing the linearity of high resolution ADCs. With this method, linearity requirement of the source can be dramatically relaxed and faster sources can be utilized to reduce the test time and increase test coverage for the ADC. Preliminary simulation results show that with a 5-bit linear input signal, the trip points of a 11-bit Flash ADC can be identified to better than 0.5LSB and by incorporating a built-in calibration circuit, the trip point error can be decreased from an uncalibrated 15 LSB level (7-bit performance) to less than 0.5 LSB (11-bit performance) or better.
Keywords :
analogue-digital conversion; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; 11 bit; AM-BIST algorithm; built-in calibration circuit; flash ADC; histogram; linearity; mixed-signal integrated circuit; stationary nonlinear signal; trip point error; Built-in self-test; Calibration; Circuit testing; Costs; Histograms; Linearity; Production; Signal generators; Signal processing; Signal processing algorithms;
Conference_Titel :
Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Print_ISBN :
0-7803-7523-8
DOI :
10.1109/MWSCAS.2002.1186851
