DocumentCode :
3292174
Title :
An alternative solution to TPS re-host
Author :
Kotara, Pete
Author_Institution :
Eng. Spectrum Inc., San Antonio, TX, USA
fYear :
2004
fDate :
20-23 Sept. 2004
Firstpage :
610
Lastpage :
613
Abstract :
The aging and obsolescence of automatic test systems (ATS) is causing many programs to look at re-hosting their test program sets (TPSs) to modern test systems. The major problem is that this undertaking is both time consuming and expensive. With budgets decreasing, program managers have to find innovative ways to do more with less. To find those innovative ways, we must look at non traditional methods of TPS development. We must be willing to consider that there are alternate solutions, and we must take them into consideration when making a decision on which ATS to re-host our TPSs. This paper discusses one of the alternative solutions to re-hosting TPSs that realize a significant savings in both time and money over the use of traditional ATS. Specifically it talks about using an in circuit test system (PinPoint II from DiagnoSYS Systems, Inc.) to re-host digital circuit boards from a legacy ATS and the techniques used to accomplish this task. This approach is not intended to fit all situations, but in the right situation, it can be very effective. To get the most out of this approach, it is important to identify exactly which TPSs are good candidates, and which are not. To illustrate how this can be done, the process used by the AWACS program to find a cost effective way of re-hosting TPSs from their obsolete depot tester (AN/GSM-285) is outlined. The outline describes the criteria used to determine which circuit cards are good candidates, and the differences in techniques used with this approach compared to traditional TPS development. It also describe the limitations as well as the benefits obtained by using this approach. Examples are given that illustrate the cost savings that can be realized over the use of traditional ATS.
Keywords :
aerospace computing; automatic testing; digital integrated circuits; integrated circuit testing; ATS; AWACS program; TPS re-hosting; automatic test system; circuit test system; digital circuit board; test program set; Aging; Automatic testing; Circuit testing; Costs; Digital circuits; Financial management; Innovation management; Strontium; System testing; Weapons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON 2004. Proceedings
ISSN :
1088-7725
Print_ISBN :
0-7803-8449-0
Type :
conf
DOI :
10.1109/AUTEST.2004.1436963
Filename :
1436963
Link To Document :
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