Title :
Triple Well CMOS Active Pixel Sensor with In-Pixel Full Signal Analog
Author :
Rizzo, G. ; Batignani, G. ; Bettarini, S. ; Bosisio, L. ; Carpinelli, M. ; Calderini, G. ; Cenci, R. ; Forti, F. ; Giacomini, G. ; Giorgi, M.A. ; Lanceri, L. ; Lusiani, A. ; Manghisoni, M. ; Marchiori, G. ; Morsani, F. ; Neri, N. ; Paoloni, E. ; Rachevska
Author_Institution :
Univ. degli Studi di Pisa
Abstract :
We report on a new approach in the design of CMOS monolithic active pixel sensor (MAPS). We realized a first MAPS prototype chip implementing at the pixel level the standard processing chain commonly used for capacitive detectors. The in-pixel signal processing channel includes a low noise charge preamplifier, a shaper, a discriminator and a latch. This readout approach, realized exploiting the triple well option available in the 0.13 mum process by STMicrolectronics, is compatible with already available architectures performing data sparsification at the pixel level. This feature will be implemented in future development of our device to improve the readout speed potential of these sensors with respect to existing MAPS. Using a charge preamplifier to perform charge to voltage conversion, we also extended the area of the sensing electrode to increase the signal collected by a single pixel. The first prototype chips have been successfully tested with very encouraging results. In this paper we summarize the performance of the front-end electronics and present the response of the sensor to ionizing radiation
Keywords :
CMOS image sensors; discriminators; position sensitive particle detectors; preamplifiers; readout electronics; semiconductor counters; signal processing; MAPS prototype chip; capacitive detectors; charge-to-voltage conversion; data sparsification; discriminator; front-end electronics; in-pixel full signal analog processing channel; ionizing radiation; low noise charge preamplifier; readout speed potential; triple well CMOS monolithic active pixel sensor; Detectors; Electrodes; Ionizing radiation sensors; Latches; Noise shaping; Preamplifiers; Prototypes; Signal processing; Testing; Voltage;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2005 IEEE
Conference_Location :
Fajardo
Print_ISBN :
0-7803-9221-3
DOI :
10.1109/NSSMIC.2005.1596600