Title :
Underlap channel UTBB MOSFETs for low—power analog/RF applications
Author :
Kranti, Abhinav ; Burignat, S. ; Raskin, J.P. ; Armstrong, G.A.
Author_Institution :
Sch. of Electron., Electr. Eng. & Comput. Sci., Queen´´s Univ. Belfast, Belfast
Abstract :
In this work, we report on the significance of underlap channel architecture in Ultra Thin Body BOX (UTBB) fully-depleted (FD) SOI MOSFETs to improve analog/RF performance metrics. It is shown that at lower current levels and shorter gate lengths, underlap UTBB MOSFETs can achieve significant improvement > 1.5 times in key analog/RF metrics over devices designed with conventional S/D architecture. Analog/RF figures of merit are analyzed in terms of spacer-to-straggle ratio (s/sigma), a key parameter for the design of underlap devices. Results suggest that underlap S/D design with s/sigma ratio of 3.3 is optimum to enhance analog/RF metrics at low current levels (< 60 muA/mum). The present work provides new viewpoints for realizing future low-power analog devices/circuits with underlap UTBB FETs.
Keywords :
MOSFET; low-power electronics; silicon-on-insulator; analog-RF performance metrics; conventional S-D architecture; current levels; gate lengths; low-power analog devices; low-power circuits; spacer-to-straggle ratio; ultrathin body box fully-depleted SOI MOSFETs; underlap channel UTBB MOSFETs; Analytical models; Application software; Cutoff frequency; Doping profiles; MOSFETs; Radio frequency; Semiconductor films; Silicon; Substrates; Voltage; Analog/RF; Cut—off frequency; Low-voltage applications; SOI MOSFETs; Underlap channel architecture; Voltage gain;
Conference_Titel :
Ultimate Integration of Silicon, 2009. ULIS 2009. 10th International Conference on
Conference_Location :
Aachen
Print_ISBN :
978-1-4244-3704-7
DOI :
10.1109/ULIS.2009.4897564