Title :
The impact on electric characteristics of solar modules by its internal defects
Author :
Yongqing, Wang ; Ailing, Cai ; Rongxia, Sun ; Yukun, Guo
Author_Institution :
Coll. of Electron. & Informational Eng., Hebei Univ., Baoding, China
Abstract :
Combined with the corresponding infrared images and experimental verification, the paper analyzed impacts on the electrical property of modules caused by the internal defects aiming at the output characteristic curves measured by the Solar Simulator.
Keywords :
electric properties; infrared imaging; solar cell arrays; electric characteristics; electrical property; infrared images; internal defects; solar modules; solar simulator; Analytical models; Anodes; Cathodes; Electric variables; Electric variables measurement; Image analysis; Infrared detectors; Infrared imaging; Sun; Testing;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location :
Suzhou, Jiangsu
Print_ISBN :
978-1-4244-3911-9
Electronic_ISBN :
1946-1542
DOI :
10.1109/IPFA.2009.5232550
