Title :
SOI Low Power I.model For Analog And Digital Circuits Calibrated Using Virtual Wafer Fab
Author :
Lai, J.C. ; Yue, J. ; Beaudoin, K.P.
Keywords :
Charge carrier processes; Digital circuits; Diodes; Electron mobility; Impact ionization; Large Hadron Collider; MOS devices; Semiconductor device modeling; Temperature; Voltage;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-4131-7
DOI :
10.1109/VTSA.1997.614926
