The effects of the interface and surface treatment on the electron emission from diamond coated field emitters

Author

Choi, W.B. ; Myers, A.F. ; Wojak, G.J. ; McClure, M.T. ; Cuomo, J.J. ; Hren, J.J.

Author_Institution

Dept. of Mater. Sci. & Eng., North Carolina State Univ., Raleigh, NC, USA

fYear

1996

fDate

7-12 Jul 1996

Firstpage

288

Lastpage

292

Abstract

To improve the performance of molybdenum and silicon field emitters, thin diamond layers were deposited on needles by dielectrophoresis. Field emission characteristics were investigated before and after diamond deposition. SEM and TEM observation demonstrated that a significant amount of diamond was deposited. The emissivity depended upon the thickness deposited, the thermal treatment of the diamond after deposition. The influence of the emitter/diamond interface and the surface treatment of the diamond, are reported here, along with a discussion of the possible mechanisms

Keywords

diamond; electron field emission; electrophoresis; interface phenomena; scanning electron microscopy; surface treatment; transmission electron microscopy; vacuum microelectronics; C-Mo; C-Si; Mo field emitters; SEM observation; Si field emitters; TEM observation; diamond coated field emitters; diamond deposition; dielectrophoresis; electron emission; emissivity; emitter/diamond interface; surface treatment; thermal treatment; thin diamond layers; Annealing; Atmosphere; Chemicals; Coatings; Dielectrophoresis; Electron emission; Hydrogen; Powders; Surface treatment; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International

Conference_Location

St. Petersburg

Print_ISBN

0-7803-3594-5

Type

conf

DOI

10.1109/IVMC.1996.601826

Filename

601826