• DocumentCode
    3292940
  • Title

    Silicon nanowire pinch-off FET : Basic operation and analytical model

  • Author

    Sorée, Bart ; Magnus, Wim

  • Author_Institution
    IMEC, Leuven
  • fYear
    2009
  • fDate
    18-20 March 2009
  • Firstpage
    245
  • Lastpage
    248
  • Abstract
    An analytical model has been constructed for a silicon nanowire pinch-off FET. This is a uniformly doped nanowire with surrounding oxide and gate. For large radii nanowires, in the long channel approximation, we obtain an analytical expression for the depletion length in the radial direction. Making use of the gradual channel approximation, we are able to investigate the current both above and below threshold. The results obtained from the analytical model are compared with the self-consistent numerical solutions of a self-consistent Poisson solver. We show that the subthreshold slope is 60 mV/dec and good ION/IOFF ratios and ION values are obtained for this device.
  • Keywords
    Poisson equation; field effect transistors; nanoelectronics; nanowires; semiconductor device models; silicon; ION-IOFF ratio; Si; depletion length; gradual-long channel approximation; self-consistent Poisson solver; silicon nanowire pinch-off FET; subthreshold slope; Analytical models; Electron mobility; FETs; MOSFETs; Nanoscale devices; Rough surfaces; Silicon; Surface roughness; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultimate Integration of Silicon, 2009. ULIS 2009. 10th International Conference on
  • Conference_Location
    Aachen
  • Print_ISBN
    978-1-4244-3704-7
  • Type

    conf

  • DOI
    10.1109/ULIS.2009.4897582
  • Filename
    4897582