DocumentCode
3292940
Title
Silicon nanowire pinch-off FET : Basic operation and analytical model
Author
Sorée, Bart ; Magnus, Wim
Author_Institution
IMEC, Leuven
fYear
2009
fDate
18-20 March 2009
Firstpage
245
Lastpage
248
Abstract
An analytical model has been constructed for a silicon nanowire pinch-off FET. This is a uniformly doped nanowire with surrounding oxide and gate. For large radii nanowires, in the long channel approximation, we obtain an analytical expression for the depletion length in the radial direction. Making use of the gradual channel approximation, we are able to investigate the current both above and below threshold. The results obtained from the analytical model are compared with the self-consistent numerical solutions of a self-consistent Poisson solver. We show that the subthreshold slope is 60 mV/dec and good ION/IOFF ratios and ION values are obtained for this device.
Keywords
Poisson equation; field effect transistors; nanoelectronics; nanowires; semiconductor device models; silicon; ION-IOFF ratio; Si; depletion length; gradual-long channel approximation; self-consistent Poisson solver; silicon nanowire pinch-off FET; subthreshold slope; Analytical models; Electron mobility; FETs; MOSFETs; Nanoscale devices; Rough surfaces; Silicon; Surface roughness; Voltage; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultimate Integration of Silicon, 2009. ULIS 2009. 10th International Conference on
Conference_Location
Aachen
Print_ISBN
978-1-4244-3704-7
Type
conf
DOI
10.1109/ULIS.2009.4897582
Filename
4897582
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