DocumentCode :
3292940
Title :
Silicon nanowire pinch-off FET : Basic operation and analytical model
Author :
Sorée, Bart ; Magnus, Wim
Author_Institution :
IMEC, Leuven
fYear :
2009
fDate :
18-20 March 2009
Firstpage :
245
Lastpage :
248
Abstract :
An analytical model has been constructed for a silicon nanowire pinch-off FET. This is a uniformly doped nanowire with surrounding oxide and gate. For large radii nanowires, in the long channel approximation, we obtain an analytical expression for the depletion length in the radial direction. Making use of the gradual channel approximation, we are able to investigate the current both above and below threshold. The results obtained from the analytical model are compared with the self-consistent numerical solutions of a self-consistent Poisson solver. We show that the subthreshold slope is 60 mV/dec and good ION/IOFF ratios and ION values are obtained for this device.
Keywords :
Poisson equation; field effect transistors; nanoelectronics; nanowires; semiconductor device models; silicon; ION-IOFF ratio; Si; depletion length; gradual-long channel approximation; self-consistent Poisson solver; silicon nanowire pinch-off FET; subthreshold slope; Analytical models; Electron mobility; FETs; MOSFETs; Nanoscale devices; Rough surfaces; Silicon; Surface roughness; Voltage; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultimate Integration of Silicon, 2009. ULIS 2009. 10th International Conference on
Conference_Location :
Aachen
Print_ISBN :
978-1-4244-3704-7
Type :
conf
DOI :
10.1109/ULIS.2009.4897582
Filename :
4897582
Link To Document :
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