• DocumentCode
    3293031
  • Title

    Ultrasonic time-of-flight method for on-line quantitation of semiconductor gases

  • Author

    Cadet, Curdy ; Valdes, J.L. ; Mitchell, J.W.

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • fYear
    1991
  • fDate
    8-11 Dec 1991
  • Firstpage
    295
  • Abstract
    An ultrasonic method is described for online determination of on-demand generated arsine in process streams. For online monitoring of dangerously toxic gases, the ultrasonic method has proven to be superior to other techniques. Accurate, noninvasive, real-time determinations of arsine in hydrogen have been accomplished. Highly precise experimental calibrations are in excellent agreement with theoretical predictions based on an appropriate acoustic model. The acoustic time-of-flight method was also found to be insensitive to pressure and volumetric gas flows. For these reasons, it is a versatile and practical tool for monitoring a broad range of binary gas flow streams of reagents used for device fabrication
  • Keywords
    arsenic compounds; gas sensors; semiconductor technology; time of flight spectra; ultrasonic applications; AsH3; acoustic time-of-flight method; arsine; semiconductor gases; toxic gas monitoring; ultrasonic method; Chemical vapor deposition; Gases; Hydrogen; Inductors; Molecular beam epitaxial growth; Monitoring; Semiconductor materials; Ultrasonic variables measurement; Velocity measurement; Weight control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1991. Proceedings., IEEE 1991
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1991.234173
  • Filename
    234173