Title :
An stability measurement instrument with high precision and great measurement range quality
Author :
Bayi, Qu ; Xingle, Feng ; Jiang´an, Wang ; Wei, Li
Author_Institution :
Sch. of Inf. Eng., Chang´´an Univ., Xi´´an, China
Abstract :
At present there is a big demand to the stability test instrument. In this article, an instrument for measuring Allen devision is designed based on the DDS technology as well as a high precious frequency measurement method that measure the difference frequency´s period of the under test frequency and the reference. The instrument´s background stability surpasses 4.0*10-12/ls, 1.5×10-12/10s and its measurement range is form 1MHz to 30MHz at present. It mainly has high accuracy and great measurement range compared with the overseas main product.
Keywords :
direct digital synthesis; frequency measurement; test equipment; Allen devision measurement; DDS technology; frequency 1 MHz to 30 MHz; frequency measurement method; measurement range quality; stability measurement Instrument; stability test instrument; Delay; Educational institutions; Field programmable gate arrays; Frequency control; Instruments; Time frequency analysis; Allen devision; DDS; difference of two frequencies; stability;
Conference_Titel :
Electric Information and Control Engineering (ICEICE), 2011 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-8036-4
DOI :
10.1109/ICEICE.2011.5778316