Title :
Supply Chain Inventory Control in Semiconductor Manufacturing
Author :
Guo, Ruey-Shan ; Chiang, David ; Yang, Po-Chun
Author_Institution :
Nat. Taiwan Univ., Taipei
Abstract :
As the semiconductor industry faces more and more fierce competition, it is essential for semiconductor supply chain to integrate back-end and front-end to provide better service to customers. This research develops a semiconductor supply chain monitoring scheme based on the concept of echelon WIP inventory and CONWIP system. The first step in the proposed scheme is to construct a two-echelon model with the goal of minimizing the echelon WIP inventory control limits under target service levels. Next, this two-echelon model is extended to a multi-echelon model. The proposed scheme has been validated through simulation study. Based on the simulation validation results, conclusions are drawn as follows: 1) The proposed scheme can derive the multi-echelon WIP inventory limits effectively; 2) Compared to the traditional stage-based inventory monitoring scheme, the proposed echelon-based monitoring scheme can obtain a higher service level with lower inventory levels.
Keywords :
semiconductor device manufacture; stock control; supply chain management; CONWIP system; echelon WIP inventory control limits; multi-echelon model; semiconductor industry; semiconductor manufacturing; semiconductor supply chain; semiconductor supply chain monitoring scheme; supply chain inventory control; two-echelon model; Electronics industry; Industrial engineering; Inventory control; Lead compounds; Monitoring; Production systems; Routing; Semiconductor device manufacture; Supply chain management; Supply chains;
Conference_Titel :
Semiconductor Manufacturing, 2006. ISSM 2006. IEEE International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
978-4-9904138-0-4
DOI :
10.1109/ISSM.2006.4493024