DocumentCode
32933
Title
New Weighted Time Lag Method for the Analysis of Random Telegraph Signals
Author
Martin-Martinez, J. ; Diaz, J. ; Rodriguez, Roberto ; Nafria, M. ; Aymerich, X.
Author_Institution
Dept. of Electron. Eng., Univ. Autonoma de Barcelona, Bellaterra, Spain
Volume
35
Issue
4
fYear
2014
fDate
Apr-14
Firstpage
479
Lastpage
481
Abstract
A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant.
Keywords
MOSFET; Monte Carlo methods; random noise; semiconductor device noise; Monte Carlo generated RTS traces; background noise; pMOS transistor; random telegraph signals; weighted time lag method; Histograms; MOSFET; Monte Carlo methods; Noise; Noise measurement; Parameter extraction; Standards; CMOS; Random telegraph signals; characterization; noise; parameter extraction;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2014.2304673
Filename
6766663
Link To Document