DocumentCode
3293474
Title
First-principles study of boron doping-induced band gap narrowing in 3C-SiC
Author
Ding Ruixue ; Yang Yintang ; Ren Xingrong ; Xi Xiaowen ; Zhang Bing
Author_Institution
Key Lab. of Minist. of Educ. for Wide Band Gap Semicond. Mater. & Devices, Xidian Univ., Xi´an, China
fYear
2009
fDate
6-10 July 2009
Firstpage
563
Lastpage
566
Abstract
Based on density functional theory (DFT), the effect of boron (B) doping concentration on band gap of 3C-SiC is investigated. The analysis of density of states (DOS) and electron distribution indicates that the band gap tends to narrow with the increase of B concentration. The top of valence band, is contributed from B 2p level, and the bottom of conduction band, from B 2s in B-doped 3C-SiC. Both of them shift towards lower energy direction. With B concentration increases, the displacement of the bottom of conduction band is larger than that of the top of valence band, resulting in the narrowing of band gap. This result is useful for controlling band gap of doped 3C-SiC, and should be helpful for enhancing reliability and broadening the application ranges of SiC devices.
Keywords
ab initio calculations; boron; conduction bands; density functional theory; energy gap; semiconductor doping; silicon compounds; wide band gap semiconductors; SiC; band gap narrowing; boron concentration; boron doping concentration; conduction band; density functional theory; density of states; electron distribution; valence band; Boron; Crystallization; Doping; Electrons; Laboratories; Microelectronics; Photonic band gap; Schottky diodes; Silicon carbide; Wide band gap semiconductors;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
Conference_Location
Suzhou, Jiangsu
ISSN
1946-1542
Print_ISBN
978-1-4244-3911-9
Electronic_ISBN
1946-1542
Type
conf
DOI
10.1109/IPFA.2009.5232584
Filename
5232584
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