• DocumentCode
    3293474
  • Title

    First-principles study of boron doping-induced band gap narrowing in 3C-SiC

  • Author

    Ding Ruixue ; Yang Yintang ; Ren Xingrong ; Xi Xiaowen ; Zhang Bing

  • Author_Institution
    Key Lab. of Minist. of Educ. for Wide Band Gap Semicond. Mater. & Devices, Xidian Univ., Xi´an, China
  • fYear
    2009
  • fDate
    6-10 July 2009
  • Firstpage
    563
  • Lastpage
    566
  • Abstract
    Based on density functional theory (DFT), the effect of boron (B) doping concentration on band gap of 3C-SiC is investigated. The analysis of density of states (DOS) and electron distribution indicates that the band gap tends to narrow with the increase of B concentration. The top of valence band, is contributed from B 2p level, and the bottom of conduction band, from B 2s in B-doped 3C-SiC. Both of them shift towards lower energy direction. With B concentration increases, the displacement of the bottom of conduction band is larger than that of the top of valence band, resulting in the narrowing of band gap. This result is useful for controlling band gap of doped 3C-SiC, and should be helpful for enhancing reliability and broadening the application ranges of SiC devices.
  • Keywords
    ab initio calculations; boron; conduction bands; density functional theory; energy gap; semiconductor doping; silicon compounds; wide band gap semiconductors; SiC; band gap narrowing; boron concentration; boron doping concentration; conduction band; density functional theory; density of states; electron distribution; valence band; Boron; Crystallization; Doping; Electrons; Laboratories; Microelectronics; Photonic band gap; Schottky diodes; Silicon carbide; Wide band gap semiconductors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the
  • Conference_Location
    Suzhou, Jiangsu
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4244-3911-9
  • Electronic_ISBN
    1946-1542
  • Type

    conf

  • DOI
    10.1109/IPFA.2009.5232584
  • Filename
    5232584